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Joint Test Action Group
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191	onTAP® Series 4000 with ProScan B o u n d a r y S c a n Add to Reading List Source URL: www.flynn.com Language: English - Date: 2014-04-01 12:09:05 IEEE standards Embedded systems Electronic engineering Joint Test Action Group Field-programmable gate array OnTap Electronics manufacturing Electronics Manufacturing
192	ARM 7TDMI Data Sheet Issued: August 1995 Copyright Advanced RISC Machines Ltd (ARMAll rights reserved Add to Reading List Source URL: www.ndsretro.com Language: English - Date: 2006-12-01 15:44:11 Central processing unit Instruction set architectures ARM architecture Embedded systems ARM7 Instruction set Joint Test Action Group Reduced instruction set computing Microprocessor Computer architecture Computer hardware Electronic engineering
193	_ V14.01 WHITEPAPER Connecting to the target without a cable Add to Reading List Source URL: www.isystem.com Language: English - Date: 2014-02-13 08:27:22 Electronics Debugging IEEE standards Debuggers Electronics manufacturing Joint Test Action Group Breakpoint Bluetooth Software bug Computing Embedded systems Computer programming
194	UM10889 LPCXpresso4337/43S37/18S37 Rev. 1.1 — February 18th 2015 User manual Add to Reading List Source URL: www.lpcware.com Language: English - Date: 2015-05-03 08:08:30 Microcontrollers Electronic engineering Joint Test Action Group Universal Serial Bus Arduino Electronics Computer hardware Embedded systems
195	onTAP® Series 4000 with ProScan B o u n d a r y S c a n Add to Reading List Source URL: www.flynn.com Language: English - Date: 2011-06-14 10:41:17 Electromagnetism Electronic design automation Joint Test Action Group Boundary scan Netlist Cross-linked polyethylene OnTap Electronics manufacturing Manufacturing Electronic engineering
196	Microsoft Word - dlp2232m-v14-ds.doc Add to Reading List Source URL: www.ftdichip.com Language: English - Date: 2012-05-14 07:25:05 Electronic engineering Non-volatile memory Integrated circuits Data transmission Universal asynchronous receiver/transmitter Universal Serial Bus Intel MCS-51 Joint Test Action Group RS-232 Computer hardware Microcontrollers Electronics
197	PIC24FJ64GB004 Family Data SheetPin, 16-Bit, Flash Microcontrollers with USB On-The-Go (OTG) and nanoWatt XLP Technology Add to Reading List Source URL: ww1.microchip.com Language: English - Date: 2010-08-16 12:31:55 Computer architecture PIC microcontroller Universal Serial Bus Serial Peripheral Interface Bus In-circuit serial programming USB On-The-Go EEPROM Joint Test Action Group UNI/O Microcontrollers Computer hardware Electronics
198	® onTAP with ProScan Boundary Scan Test Software onTAP Series 4000 Expert Solution Add to Reading List Source URL: www.flynn.com Language: English - Date: 2014-10-30 11:24:44 Electronic engineering Boundary scan Joint Test Action Group Automatic test pattern generation Berkeley Software Distribution NetApp Electronics manufacturing Manufacturing Electronics
199	Intrinsic Quality www.xjtag.com XJTAG Technology Partner Add to Reading List Source URL: www.xjtag.com Language: English - Date: 2009-11-09 05:57:02 Cross-platform software Numerical software Electronics LabWindows/CVI LabVIEW Joint Test Action Group In-circuit test National Instruments Boundary scan Electronics manufacturing Software Manufacturing
200	_ V9Technical Notes Add to Reading List Source URL: www.isystem.com Language: English - Date: 2014-09-05 04:49:30 Computer programming IEEE standards Electronics manufacturing Microcontrollers Joint Test Action Group Debugging Debugger ARM architecture Debug Computing Electronics Embedded systems

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